Analytics

The Veeco Dektak is a fast tool for measuring surface profiles and step heights in the micro and nanometer range.

• Contact profilometer with nanometer accuracy
  
• Compatible with samples up to 200 mm (8 inch) diameter
• maximum step height 1 mm 

Spectroscopic film thickness measurement system

• 15 nm - 70 µm thickness range
• measurment of refractive index
• large material library avaliable

3D Laser Scanning Microscope

• 3D profilometry via confocal laser scanning, focus variation and white light interferometry
• sub-nanometer z resolution
• film thickness measurement
• automated measurements and stitching
  
• powerful analysis software