Analytics

The Veeco Dektak 150 stylus profilometer is a fast tool for measuring surface profiles and step heights in the micro and nanometer range.

• Contact profilometer with nanometer accuracy
  
• Compatible with samples up to 200 mm (8 inch) diameter
• Maximum step height 1 mm 

Filmetrics F20 Thin Film Spectrometer, a spectroscopic film-thickness measurement system

• 15 nm - 70 µm thickness range
• Measurement of refractive index
• Large material library avaliable

Keyence VK-X 3000 Confocal Laser Scanning Microscope

• 3D profilometry via confocal laser scanning, focus variation and white-light interferometry
• Sub-nanometer z resolution
• Film-thickness measurement
• Automated measurements and stitching
  
• Powerful analysis software